JSM-IT510 Analytical SEM InTouchScope™ SEM Series from JEOL USA, Inc.

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JEOL USA, Inc. for
JSM-IT510 Analytical SEM InTouchScope™ SEM Series

Description

A versatile research grade SEM with 'Zeromag' software and Live Analysis. Both high vacuum and low vacuum models are available with or without embedded EDS system. This SEM features a large sample chamber with a stage. The stage is mounted inside the chamber, enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber. Multiple ports are optimally positioned for analytical attachments such as: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), cathodoluminescence detectors (CL), wavelength dispersive X-ray spectrometer (WDS), chamberscopes, heating/cooling sub-stages, etc.

  • Large sample chamber
  • Zeromag simplifies navigation with seamless transition from an optical to SEM image
  • High throughput microanalysis with analytical models with full integration of EDS
  • High resolution with unsurpassed low kV performance
  • High vacuum to expanded pressure in low vacuum mode
  • Large specimen chamber with multiple ports
  • SmileView™ Lab for integrated management of image and analysis data

Features
  • Specimen Exchange Navi – Integrated step-by-step guide from specimen introduction to automatic image formation. Unprecedented Ease of Use at any level!
  • Zeromag – Simplifies Navigation and enhances throughput. Providing a seamless transition from an optical (or holder graphic) to SEM image
  • Live EDS – Full integration of JEOL EDS with Real-Time Live spectrum and Live X-ray map.
  • Simple SEM – simplify workflow and automate routine imaging tasks.